Ponente
Stefano Capra
(University of Milano)
Descripción
In this talk the latest advances in integrated pre-amplifiers for semiconductor detectors will be explored. In particular, an innovative device will be described that allows to perform simultaneously high-energy and low energy, high resolution spectroscopy. This device also minimizes the deadtime in case of saturation and configures itself as the ideal readout solution to detect both heavy ion implantation and the following decay. This integrated pre-amplifier is particularly suitable for high-density multichannel solution, being characterized also by extremely low power consumption. Integration of this preamp with existing DAQ systems will also be also discussed.
