Metrology PCB DRD6 - IJCLAB/IFIC

Europe/Madrid
Descripción

Join Zoom Meeting
https://cern.zoom.us/j/66685295226?pwd=Z2xja0tRdXdlaHRiaDY1SmpBeU5XQT09
 
Meeting ID: 666 8529 5226
Passcode: 262008

Attendants:

IFIC - César Blanch, Adrián Irles, Carlos Orero

IJLab - Dominique Breton, Roman Poeschl, Alice Thiebault

 

Slides shared by Adrián.

Very fresh results from this morning: optical and contact probe machine at IFIC give compatible results.

 

- Next steps:

  • Documentation / methodology
    • Document everything (procedures, machines, conditions, etc) and share it
  • Metrology naked boards
    • IFIC (~1 week)
      • Replicate conditions of the measurement as in IJCLab (same type of mechanical support)
        • Measure the board with the optical machine and with a contact machine
      • Better control/monitoring of temperature during measurements.
      • Pack the card FEV2.1_id5 in dry packing and send it to IJCLAb
    • IJCLab finish the measurements of the current cards
      • Repeat with no mechanical support if possible
      • Send the naked cards to IFIC (two?)
  • Glue tests:
    • IJCLab: send "dummy" FeV2.1 to IFIC for gluing tests
    • IFIC: glue tests with dummy PCBs and sensors (June/July?)
  • Metrology of real boards:
    • Once the metrology procedure is defined clearly : several boards are to be sent to IFIC to proceed with measurements in controlled conditions.
      • Choose the best ones.

Comments/additions are welcome.

Hay actas adjuntadas a este evento. Mostrarlas.
    • 11:30 11:50
      IFIC 20m
      Ponentes: Adrian Irles (IFIC (UV/CSIC) Valencia (ES)), Sr. Carlos Orero Canet (IFIC), César Blanch (IFIC)
    • 11:50 12:10
      IJCLab 20m
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