Attendants:
IFIC - César Blanch, Adrián Irles, Carlos Orero
IJLab - Dominique Breton, Roman Poeschl, Alice Thiebault
Slides shared by Adrián.
Very fresh results from this morning: optical and contact probe machine at IFIC give compatible results.
- Next steps:
- Documentation / methodology
- Document everything (procedures, machines, conditions, etc) and share it
- Metrology naked boards
- IFIC (~1 week)
- Replicate conditions of the measurement as in IJCLab (same type of mechanical support)
- Measure the board with the optical machine and with a contact machine
- Better control/monitoring of temperature during measurements.
- Pack the card FEV2.1_id5 in dry packing and send it to IJCLAb
- IJCLab finish the measurements of the current cards
- Repeat with no mechanical support if possible
- Send the naked cards to IFIC (two?)
- Glue tests:
- IJCLab: send "dummy" FeV2.1 to IFIC for gluing tests
- IFIC: glue tests with dummy PCBs and sensors (June/July?)
- Metrology of real boards:
- Once the metrology procedure is defined clearly : several boards are to be sent to IFIC to proceed with measurements in controlled conditions.
Comments/additions are welcome.
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