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SUMMARY:Reliability in KM3NeT electronics: FIDES and HALT
DTSTART;VALUE=DATE-TIME:20200312T105500Z
DTEND;VALUE=DATE-TIME:20200312T110500Z
DTSTAMP;VALUE=DATE-TIME:20260418T113945Z
UID:indico-contribution-12395@indico.ific.uv.es
DESCRIPTION:Speakers: Diego Real (IFIC)\nTwo neutrino telescopes are being
  installed in the Mediterranean Sea by the KM3NeT Collaboration. In order 
 to qualify the electronics two different approaches are taken:  The FIDES 
 method\, performed to all the electronics boards\, is used to order to obt
 ain an estimate of the Failure In Time\, as well as to find which componen
 ts can be optimized in order to increase the reliability of the boards. In
  addition\, the Highly Accelerated Life Tests strategy\, a stress testing 
 methodology for enhancing product reliability\, performed to the first pro
 totypes of the electronics boards is presented.\n\nhttps://indico.ific.uv.
 es/event/4029/contributions/12395/
LOCATION:Universe
URL:https://indico.ific.uv.es/event/4029/contributions/12395/
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