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VERSION:2.0
PRODID:-//CERN//INDICO//EN
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SUMMARY:The Ion Beam Induced Charge (IBIC) technique to characterize semic
 onductor detectors using low energy particle accelerator
DTSTART;VALUE=DATE-TIME:20161128T165000Z
DTEND;VALUE=DATE-TIME:20161128T171000Z
DTSTAMP;VALUE=DATE-TIME:20260815T005920Z
UID:indico-contribution-3768@indico.ific.uv.es
DESCRIPTION:Speakers: Javier Garcia Lopez (Dept. Atomic\, Molecular and Nu
 clear Physics and National Accelerator Center. University of Sevilla. Spai
 n)\nhttps://indico.ific.uv.es/event/2780/contributions/3768/
LOCATION:Paraninfo. Universidad de Zaragoza
URL:https://indico.ific.uv.es/event/2780/contributions/3768/
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